Structured Illumination Microscopy
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L.G. Krzewina & M.K. Kim, “Single-exposure optical sectioning by color structured illumination microscopy”, Opt. Lett. 31, 477-479 (2006). > pdf

Structured illumination microscopy (SIM) is a wide-field technique that rivals confocal microscopy in optical sectioning ability at a small fraction of the acquisition time. For standard detectors such as a CCD camera, SIM requires a minimum of three sequential frame captures, limiting its usefulness to static objects. By using a color grid and camera, we surpass this limit and achieve optical sectioning with just a single image acquisition. The extended method is now applicable to moving objects and improves the speed of threedimensional imaging of static objects by at least a factor of three.