Structured illumination microscopy (SIM) is a wide-field technique that rivals confocal microscopy in optical
sectioning ability at a small fraction of the acquisition time. For standard detectors such as a CCD camera,
SIM requires a minimum of three sequential frame captures, limiting its usefulness to static objects. By
using a color grid and camera, we surpass this limit and achieve optical sectioning with just a single image
acquisition. The extended method is now applicable to moving objects and improves the speed of threedimensional
imaging of static objects by at least a factor of three.
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