Department of Geology
Center for Geochemical Analysis
|
Department of Geology |
Center for Geochemical Analysis |
|
Optical Emmissions Spectrometers Perkin Elmer Optima 2000 DV ICP-OES
Up to 70 elements can be detected at trace levels by inductively coupled plasma-optical emission spectrometry (ICP-OES). The Optima 2000 DV experiences low physical, chemical and spectral interferences and combined with background correction techniques facilitated by the WinLab 32 software offer detection limits close to 1 ppb (ug/L) for most elements. Analyses on water are performed in accordance with the EPA Method 700.0, which is approved for drinking and environmental water samples. ARL DCP-OES
We maintain a Direct Current Plasma Emission Spectrometer (DCP) as the "workhorse" instrument for the chemical analysis of rocks and other geologically-relevant solids. The DCP can also be used for the determination of trace-level B, Be, and Li abundances in rocks and fluids - a unique capability not routinely available in any other U.S. laboratory. Additional information on the DCP can be found at http://www.cas.usf.edu/%7Ejryan/toys.html
|
